“For the highly successful conception, design, fabrication, and commercialization of an ergonomic three-dimensional local-electrode atom probe (LEAP) tomograph that enables the determination of the local composition information, on an atom-by-atom basis, of metallic, semiconducting, ceramic and organic materials, on a subnanometer scale, in direct space, with high mass resolving power and signal-to-noise ratio, permitting the determination of small concentrations of all elements."
(with Thomas F. Kelly and David J. Larson)