Panelists:
James Coleman, University of Illinois Urbana-Champaign, United States
Bernardette Kunert, IMEC, Belgium
Shinji Matsuo, NTT Device Technology Laboratories, Japan
Hoe Tan, The Australian National University, Australia
Qiang Li, Cardiff University, United Kingdom
Bei Shi, University of California, Santa Barbara, United States
Jean Decobert, III/V Laboratory, France
Kai Cheng, Enkris Semiconductor, China